ON DIE THERMAL SENSOR AND METHOD FOR MEASURING INTERNAL TEMPERATURE OF SEMICONDUCTOR MEMORY DEVICE

摘要

An on die thermal sensor(ODTS) and a method for measuring internal temperature of a semiconductor memory device are provided to measure the internal temperature by defining operation time according to the internal temperature of the semiconductor memory device. An internal temperature sensing unit(10) measures internal temperature of a semiconductor memory device, and outputs a plurality of temperature information signals having logic level corresponding to the measured temperature. A self refresh oscillation unit(30) provides a self refresh period corresponding to the measured temperature in response to the plurality of temperature information signals. A temperature information signal oscillation unit(20) determines sensing period of the internal temperature sensing unit in response to a temperature sensing enable signal and the plurality of temperature information signals.