发明名称 |
Probe, printed circuit board testing device and printed circuit board testing method |
摘要 |
A probe is mountable to a printed circuit board testing device which performs a test on a predetermined land and/or a predetermined via hole of a printed circuit board. The probe includes a probe tip and a protrusion. The probe tip is contactable with the land and/or the via hole and projectable from the probe. The protrusion is disposed at a surface of the probe, the surface of the probe being disposed opposite to where the probe tip is projectable. The protrusion is grounded by a reaction pressure that is generated when the probe tip contacts the land and/or the via hole.
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申请公布号 |
US7339386(B2) |
申请公布日期 |
2008.03.04 |
申请号 |
US20050289452 |
申请日期 |
2005.11.30 |
申请人 |
FUJITSU LIMITED |
发明人 |
MIYAZAWA SUSUMU;HARA MIKIO;KAGIYAMA SYUJI;MORI YASUO;YOSHIZU KYOSUKE;MAKITA SHIGENORI;MIYAZAWA YOSHINO |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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