发明名称 Probe, printed circuit board testing device and printed circuit board testing method
摘要 A probe is mountable to a printed circuit board testing device which performs a test on a predetermined land and/or a predetermined via hole of a printed circuit board. The probe includes a probe tip and a protrusion. The probe tip is contactable with the land and/or the via hole and projectable from the probe. The protrusion is disposed at a surface of the probe, the surface of the probe being disposed opposite to where the probe tip is projectable. The protrusion is grounded by a reaction pressure that is generated when the probe tip contacts the land and/or the via hole.
申请公布号 US7339386(B2) 申请公布日期 2008.03.04
申请号 US20050289452 申请日期 2005.11.30
申请人 FUJITSU LIMITED 发明人 MIYAZAWA SUSUMU;HARA MIKIO;KAGIYAMA SYUJI;MORI YASUO;YOSHIZU KYOSUKE;MAKITA SHIGENORI;MIYAZAWA YOSHINO
分类号 G01R31/02 主分类号 G01R31/02
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