发明名称 Method and apparatus for jitter measurement using phase and amplitude undersampling
摘要 An apparatus and method for measuring jitter using phase and amplitude undersampling. A sampling circuit samples an input signal to obtain amplitude and phase information, a computation circuit determines Time Interval Error (TIE) information from the amplitude and phase information, and a signal processor processes the TIE information to generate a jitter spectrum.
申请公布号 US7339984(B1) 申请公布日期 2008.03.04
申请号 US20030656929 申请日期 2003.09.05
申请人 AGILENT TECHNOLOGIES, INC. 发明人 DAOU FADI
分类号 H04B17/00 主分类号 H04B17/00
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