发明名称 Methods of fabricating a single transistor floating body DRAM cell having recess channel transistor structure
摘要 Methods of fabricating a single transistor floating body dynamic random access memory (DRAM) cell include forming a barrier layer on a semiconductor substrate. A body layer is formed on the barrier layer. An isolation layer is formed defining a floating body region within the body layer. A recess region is formed in the floating body region. A gate electrode is formed in the recess region. Impurity ions of a first conductivity type are implanted into a portion of the floating body region on a first side of the recess region to define a source region and into a portion of the floating body on an opposite side of the recess region to define a drain region to provide a floating body.
申请公布号 US7338862(B2) 申请公布日期 2008.03.04
申请号 US20060335333 申请日期 2006.01.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HUO ZONG-LIANG;BAIK SEUNG-JAE;YEO IN-SEOK;YOON HONG-SIK;KIM SHI-EUN
分类号 H01L21/336 主分类号 H01L21/336
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