发明名称 Interferometric measuring device utilizing a slanted probe filter
摘要 An interferometric measuring device for recording shape, roughness or separation distance of the surface of a measuring object, having a modulating interferometer, to which is supplied short coherent radiation by a radiation source, having a measuring probe that is spatially separated from the modulating interferometer and is coupled to it via a light-conducting fiber set-up, in which combined beam components are split in a common arm in a partially transmitting region into measuring and reference beams, and having receiver and evaluating devices for converting the supplied radiation into electrical signals and for evaluating the signals based on phase difference. A construction for reliable measurements even in tight hollow spaces provides that the partially transmitting region is formed by a slanting exit face of a probe fiber at an exit angle as to the optical probe axis and a likewise slanting entrance face, of a fiber section following on the object side, as to the optical probe axis at an entrance angle, a wedge-shaped gap being formed between the exit and entrance surfaces.
申请公布号 US7339679(B2) 申请公布日期 2008.03.04
申请号 US20050529424 申请日期 2005.03.25
申请人 ROBERT BOSCH GMBH 发明人 DRABAREK PAWEL;BREIDER DOMINIQUE;DUVOISIN MARC-HENRI;MARCHAL DOMINIQUE
分类号 G01B9/02;G01B11/24 主分类号 G01B9/02
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