发明名称 Electroplating chemistries and methods of forming interconnections
摘要 A method comprising forming an interconnection opening through a dielectric material to a contact point; and electroplating a interconnection comprising copper in the contact opening using an electroplating bath comprising an alkoxylated sulfopropylated alkylamine. A method comprising forming an interconnection opening through a dielectric material to a contact point; lining the interconnection opening with a barrier layer and a seed layer; and electroplating an interconnection comprising copper in the contact opening using an electroplating bath comprising an alkoxylated sulfopropylated alkylamine.
申请公布号 US7338585(B2) 申请公布日期 2008.03.04
申请号 US20060383925 申请日期 2006.05.17
申请人 INTEL CORPORATION 发明人 AKOLKAR ROHAN N.;DUBIN VALERY M.
分类号 C25D5/02;C25D3/38;C25D7/12 主分类号 C25D5/02
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