发明名称 Semiconductor device
摘要 A semiconductor device includes a first insulating layer provided above a semiconductor substrate. The first insulating layer includes a layer consisting essentially of a material having a relative dielectric constant smaller than 3. The first insulating layer includes a first integral structure consisting of a plug and wiring. The upper surface of the wiring is flush with the upper surface of the first insulating layer, and the lower surface of the plug is flush with the lower surface of the first insulating layer. A region protective member is formed of a second integral structure consisting of a plug and wiring. The second integral structure extends from the upper surface of the first insulating layer to the lower surface of the first insulating layer. The region protective member surrounds one of first to n-th regions (n being a natural 2 or more) partitioned by a boundary region on a horizontal plane.
申请公布号 US7339256(B2) 申请公布日期 2008.03.04
申请号 US20040974922 申请日期 2004.10.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAKAMURA NAOFUMI;MATSUNAGA NORIAKI;ITO SACHIYO;HASUNUMA MASAHIKO;NISHIOKA TAKESHI
分类号 H01L23/52;H01L29/72;H01L21/00;H01L21/3205;H01L21/822;H01L23/00;H01L23/522;H01L23/58;H01L27/04;H01L27/10;H01L29/40 主分类号 H01L23/52
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