| 摘要 |
A test handler is provided to change pitch interval according to the number of placement parts along the direction of Y-axis formed on a tray. According to a test handler(100) absorbing a semiconductor package and then loading the package on a tray, a first stopper(520) is installed in a body(200). A second stopper(530) is separated from one side of the first stopper, and is installed in the body. A first absorption part(300) is installed on the body vertically, and absorbs the semiconductor package in vacuum. A second absorption part(400) is installed on the body vertically, and absorbs the semiconductor package as moving between the first stopper and the second stopper. A replacement block is connected to the second absorption part, and suppresses the movement of the second absorption part. The interval between the first and the second absorption part is set according to the length of the replacement block. |
