发明名称 |
WET ETCHING SOLUTION HAVING HIGH SELECTIVITY FOR SILICON OXIDE |
摘要 |
A wet etchant having the selectivity to a silicon oxide layer, and a method for etching a silicon oxide layer selectively by using the wet etchant are provided to increase the selectivity of a silicon oxide layer to a metal silicide by inhibiting the etching of a metal silicide layer and by increasing the etching of a silicon oxide layer. A wet etchant having the selectivity to a silicon oxide layer comprises 0.1-3 wt% of hydrofluoric acid; 10-40 wt% of at least one inorganic acid selected from nitric acid, sulfuric acid and hydrochloric acid; and the balance of water. Also, the wet etchant comprises 0.1-10 wt% of hydrofluoric acid; 60-98 wt% of an organic acid compound having at least one carboxyl group; and the balance of water. Also the wet etchant comprises 0.1-10 parts by weight of hydrofluoric acid; 0.1-10 parts by weight of ammonium hydrofluorate; 30-50 parts by weight of an organic acid compound having at least one carboxyl group; and 30-50 parts by weight of an alcohol; and the balance of water.
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申请公布号 |
KR20080017576(A) |
申请公布日期 |
2008.02.27 |
申请号 |
KR20060078818 |
申请日期 |
2006.08.21 |
申请人 |
CHEIL INDUSTRIES INC. |
发明人 |
LA, JUNG IN;PARK, MYUNG KOOK;YANG, HO SEOK |
分类号 |
C09K13/08;C09K13/04 |
主分类号 |
C09K13/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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