发明名称 |
METHOD FOR CORRECTING IMAGE ARTEFACTS CAUSED BY DEFECTS IN A FLUORESCENT X-RAY STORAGE LAYER, AND X-RAY DEVICE |
摘要 |
<p>The invention relates to a method for correcting image artefacts (7) caused by defects in a fluorescent x-ray storage layer (4), said method comprising the following steps: a surface of incidence of the fluorescent x-ray storage layer (4) is irradiated with a pre-determined homogeneous x-ray intensity; said surface of incidence is irradiated with a pre-determined homogeneous light intensity; the intensity of the emitted scintillation light is measured for each pixel of a matrix (6a, 6b) describing the surface of incidence, and the defect pixels DBi,j corresponding to a defect are determined; and the pixels RBi,j corresponding to the defect pixels DB i,j and pertaining to a raw image RB are corrected by means of interpolation.</p> |
申请公布号 |
EP1634240(B1) |
申请公布日期 |
2008.02.27 |
申请号 |
EP20040739805 |
申请日期 |
2004.06.11 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
SCHULZ, REINER, FRANZ;FUCHS, MANFRED |
分类号 |
G06T5/00;G06T7/00;H04N5/32 |
主分类号 |
G06T5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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