发明名称 METHOD FOR CORRECTING IMAGE ARTEFACTS CAUSED BY DEFECTS IN A FLUORESCENT X-RAY STORAGE LAYER, AND X-RAY DEVICE
摘要 <p>The invention relates to a method for correcting image artefacts (7) caused by defects in a fluorescent x-ray storage layer (4), said method comprising the following steps: a surface of incidence of the fluorescent x-ray storage layer (4) is irradiated with a pre-determined homogeneous x-ray intensity; said surface of incidence is irradiated with a pre-determined homogeneous light intensity; the intensity of the emitted scintillation light is measured for each pixel of a matrix (6a, 6b) describing the surface of incidence, and the defect pixels DBi,j corresponding to a defect are determined; and the pixels RBi,j corresponding to the defect pixels DB i,j and pertaining to a raw image RB are corrected by means of interpolation.</p>
申请公布号 EP1634240(B1) 申请公布日期 2008.02.27
申请号 EP20040739805 申请日期 2004.06.11
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHULZ, REINER, FRANZ;FUCHS, MANFRED
分类号 G06T5/00;G06T7/00;H04N5/32 主分类号 G06T5/00
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