发明名称 Cleaning composition, cleaning method, and manufacturing method of semiconductor device
摘要 <p>A cleaning composition can decontaminate a surface of a chemically mechanically polished semiconductor substrate having a metal wiring and a low dielectric constant film and can highly remove impurities such as residual abrasive grains, residual polishing waste, and metal ions on the metal wiring and low dielectric constant film without corroding the metal wiring, degrading electric characteristics of the low dielectric constant film, and causing mechanical damage to the low dielectric constant film. A cleaning method of a semiconductor substrate uses the cleaning composition, and a manufacturing method of a semiconductor substrate includes a step of performing the cleaning method. The cleaning composition is used for a chemically mechanically polished surface, and includes organic polymer particles (A) having a crosslinked structure and an average dispersed particle diameter of 10 nm or more and less than 100 nm, and a complexing agent (B).</p>
申请公布号 EP1892285(A2) 申请公布日期 2008.02.27
申请号 EP20070114451 申请日期 2007.08.16
申请人 JSR CORPORATION 发明人 ANDOU, MICHIAKI;KONNO, TOMOHISA;SHIDA, HIROTAKA;UCHIKURA, KAZUHITO;KURASHIMA, NOBUYUKI;MINAMIHABA, GAKU;TATEYAMA, YOSHIKUNI;YANO HIROYUKI
分类号 C11D11/00;B82Y10/00;B82Y30/00;B82Y40/00;C11D1/14;C11D1/22;C11D1/72;C11D3/20;C11D3/30;C11D3/33;C11D3/36;C11D3/37;C11D17/06;C23G5/02;H01L21/304;H01L21/306;H01L21/321;H01L21/768;H05K3/26 主分类号 C11D11/00
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