发明名称 Method of manufacturing metal-oxide-semiconductor transistor
摘要 A method of manufacturing a metal-oxide-semiconductor transistor is provided. A substrate having a gate structure thereon is provided. A source/drain extension region is formed in the substrate on each side of the gate structure. Thereafter, a carbon-containing material layer is formed over the substrate and then the carbon-containing material layer is etched back to form spacers on the sidewalls of the gate structure. Finally, a source/drain region is formed in the substrate on each side of the spacer-coated gate structure.
申请公布号 US7335548(B2) 申请公布日期 2008.02.26
申请号 US20060378004 申请日期 2006.03.17
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG YUN-REN;YEN YING-WEI;LIU TONY E T
分类号 H01L21/00;H01L21/336;H01L21/84;H01L29/78 主分类号 H01L21/00
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