发明名称 Flexible shape identification for optical proximity correction in semiconductor fabrication
摘要 Transient edges are used to define shapes in an integrated circuit layout for optical proximity correction. A first variation of the shape includes a first edge, a second edge satisfying an edge transition angle condition in relation to the first edge, and one or more first transition edges connected between the first edge and the second edge. A second variation of the shape includes a third edge, a fourth edge satisfying the same edge transition angle condition in relation to the third edge, and one or more second transition edges connected between the third edge and the fourth edge. Although the first transition edges are different from the second transition edges, both the first and second variations of the shape are identified as having the same shape, thereby allowing flexibility and efficiency in the shape identification process for optical proximity correction.
申请公布号 US7337424(B2) 申请公布日期 2008.02.26
申请号 US20050089723 申请日期 2005.03.24
申请人 APRIO TECHNOLOGIES, INC. 发明人 WU SHAO-PO;WANG XIN;PILLOFF MARK
分类号 G06F17/50 主分类号 G06F17/50
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