发明名称 |
Time-frequency domain reflectometry apparatus and method |
摘要 |
An apparatus and method for high-resolution reflectometry that operates simultaneously in both the time and frequency domains, utilizing time-frequency signal analysis and a chirp signal multiplied by a Gaussian time envelope. The Gaussian envelope provides time localization, while the chirp allows one to excite the system under test with a swept sinewave covering a frequency band of interest. High resolution in detection of the reflected signal is provided by a time-frequency cross correlation function. The high-accuracy localization of faults in a wire/cable can be achieved by measurement of time delay offset obtained from the frequency offset of the reflected signal. The apparatus enables one to execute an automated diagnostic procedure of a wire/cable under test by control of peripheral devices.
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申请公布号 |
US7337079(B2) |
申请公布日期 |
2008.02.26 |
申请号 |
US20050519414 |
申请日期 |
2005.08.10 |
申请人 |
PARK JIN-BAE;SHIN YONG-JUNE;YOOK JONG-GWAN;POWERS EDWARD J;SONG EUN-SEOK;KIM JOO-WON;CHOE TOK-SON;SUNG SEUNG-HOON |
发明人 |
PARK JIN-BAE;SHIN YONG-JUNE;YOOK JONG-GWAN;POWERS EDWARD J.;SONG EUN-SEOK;KIM JOO-WON;CHOE TOK-SON;SUNG SEUNG-HOON |
分类号 |
G01R31/02;G01R31/08;G01R27/04;G01R31/11;H01B13/00;H02G1/06 |
主分类号 |
G01R31/02 |
代理机构 |
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