发明名称 EXPOSURE APPARATUS
摘要 <p>Provided is an exposure apparatus by which characteristic fluctuation of an optical system due to light irradiation heat can be accurately grasped. The exposure apparatus which exposes a subject (7) to be exposed to light projected from a light source (1a) is characterized in that detecting means (12, 13, 9) for detecting a light quantity of non-exposure wavelength component of the light are provided. Therefore, even when the light quantity of exposure wavelength component and the light quantity of the non-exposure wavelength component independently fluctuate, the characteristic fluctuation due to the irradiation heat of the optical system can be accurately grasped. As a result, a high performance mirror adjusting system can be also provided.</p>
申请公布号 KR20080016814(A) 申请公布日期 2008.02.22
申请号 KR20077027316 申请日期 2006.05.15
申请人 NIKON CORPORATION 发明人 SHIRAISHI MASAYUKI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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