| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection system constituted so as to be capable of reducing the effect of sensor pixel failure when the reaction result of a DNA microarray is observed using an area sensor such as a CCD or the like. SOLUTION: The inspection system is equipped with the area sensor for imaging the DNA microarray, a means for relatively moving the area sensor and the microarray, a memory circuit for storing the bad pixel position on the area sensor and a control means for controlling the moving means on the basis of the data of the bad pixel position. COPYRIGHT: (C)2008,JPO&INPIT
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