发明名称 RADICAL-ASSISTED BATCH FILM DEPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a process for simultaneously performing radical-assisted film deposition on a plurality of wafer substrates. SOLUTION: The plurality of wafer substrates are loaded into a reactor that is heated to a desired film deposition temperature. A stable species source of an oxide or nitride counter ion is introduced into the reactor. An in situ radical-generating reactant is also introduced into the reactor together with a cationic ion deposition source. The cationic ion deposition source is introduced for a time sufficient for depositing a cationic ion-oxide or a cationic-ion nitride film simultaneously on the plurality of wafer substrates. The deposition temperature is below a conventional chemical vapor deposition temperature adopted in the absence of the in situ radical-generating reactant. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008038254(A) 申请公布日期 2008.02.21
申请号 JP20070224812 申请日期 2007.08.03
申请人 AVIZA TECHNOLOGY INC 发明人 TREICHEL HELMUTH;QIU TAIQUING THOMAS;BAILEY ROBERT JEFFREY
分类号 C23C16/50;C23C16/40;C23C16/42;C23C16/455;H01L21/31 主分类号 C23C16/50
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