发明名称 |
RADICAL-ASSISTED BATCH FILM DEPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a process for simultaneously performing radical-assisted film deposition on a plurality of wafer substrates. SOLUTION: The plurality of wafer substrates are loaded into a reactor that is heated to a desired film deposition temperature. A stable species source of an oxide or nitride counter ion is introduced into the reactor. An in situ radical-generating reactant is also introduced into the reactor together with a cationic ion deposition source. The cationic ion deposition source is introduced for a time sufficient for depositing a cationic ion-oxide or a cationic-ion nitride film simultaneously on the plurality of wafer substrates. The deposition temperature is below a conventional chemical vapor deposition temperature adopted in the absence of the in situ radical-generating reactant. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008038254(A) |
申请公布日期 |
2008.02.21 |
申请号 |
JP20070224812 |
申请日期 |
2007.08.03 |
申请人 |
AVIZA TECHNOLOGY INC |
发明人 |
TREICHEL HELMUTH;QIU TAIQUING THOMAS;BAILEY ROBERT JEFFREY |
分类号 |
C23C16/50;C23C16/40;C23C16/42;C23C16/455;H01L21/31 |
主分类号 |
C23C16/50 |
代理机构 |
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