发明名称 AUTOANALYZER
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an autoanalyzing system capable of accelerating re-inspection analysis. <P>SOLUTION: The autoanalyzing system is equipped with a specimen rack for holding a specimen container in which a specimen is housed, a specimen rack charging part in which the specimen rack is charged, a feed line for feeding the specimen rack, a plurality of the autoanalyzing system arranged along the specimen rack, a specimen rack standby part for allowing the specimen rack in which the analyzed specimen is housed, to stand by, a specimen rack recovery part for recovering the specimen rack in which the analyzed specimen is housed and a feed line for re-inspection for returning the specimen rack in which the specimen to be again analyzed from an analyzing result is housed and has a control means for returning the specimen rack from the specimen rack standby part through the re-inspection feed line in the re-analysis of the specimen and performing analysis by the autoanalyzer other than an autoanalyzer used in previous analysis. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008039554(A) 申请公布日期 2008.02.21
申请号 JP20060213257 申请日期 2006.08.04
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAGI KENICHI;NODA TAKAYUKI;TAKAHASHI KENICHI;TESHIGAWARA KENJI;SUZUKI ATSUSHI
分类号 G01N35/04 主分类号 G01N35/04
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