| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a concealed image by uneven microstructure in which the reproduced image of an original image can be viewed when enlarged by a magnifier or the like and a minute pattern can be recognized when enlarged by a microscope. <P>SOLUTION: In order to attain the target of the above-mentioned problem, the concealed image is constituted of the uneven microstructure incorporated in a pattern. The concealed image is constituted of the aggregates of fine patterns having predetermined depth or predetermined height. The fine pattern is displayed by a pattern with size corresponding to luminance of a minimized part of the original image. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
