发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND DISPLAY DEVICE
摘要 <p>A semiconductor device includes a supporting layer (101) which is composed of polymeric molecules and has a thickness of 20µm or less, preferably, 10µm or less, and an element formed on the supporting layer (101). In a semiconductor device manufacturing method, a peeling layer (202) composed of aluminum, a supporting layer (203) composed of polymeric molecules, and an element are formed in this order on a substrate (201), the peeling layer (202) is dissolved by using an alkaline solution and the substrate (201) is removed. In a semiconductor device manufacturing method, a supporting layer (303) composed of polymeric molecules, and an element are formed in this order on a substrate (301), and the substrate (301) is removed by applying a mechanical force. The semiconductor device, which is thinner than conventional semiconductor devices, preferably having a total thickness of approximately 30µm or less, has characteristics which do not change even when curved or bent and returns to an original shape, is provided. The method for manufacturing such semiconductor device is also provided.</p>
申请公布号 WO2008020566(A1) 申请公布日期 2008.02.21
申请号 WO2007JP65694 申请日期 2007.08.10
申请人 HITACHI, LTD.;ROHM CO., LTD.;KATORI, SHIGETAKA;KURIHARA, TAKASHI 发明人 KATORI, SHIGETAKA;KURIHARA, TAKASHI
分类号 H01L27/12;G02F1/1368;G09F9/30;H01L21/02;H01L29/786;H01L51/50;H05B33/02;H05B33/04;H05B33/10 主分类号 H01L27/12
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