发明名称 |
NONVOLATILE MEMORY AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A non-volatile memory and a manufacturing method thereof are provided to ensure a wide memory margin and improve a characteristic of erasing operation and storage time. A non-volatile memory includes a substrate(100) and a gate structure. The gate structure has a tunneling dielectric layer(201) formed on the substrate, a first floating gate(202) formed on the tunneling dielectric layer, an interfacial dielectric layer(203) formed on the first floating gate, a second floating gate(204) formed on the facial dielectric layer and having a work function higher than the first floating gate, a control dielectric layer(205) formed on the second floating gate and a gate electrode(206) formed on the control dielectric layer.</p> |
申请公布号 |
KR100806087(B1) |
申请公布日期 |
2008.02.21 |
申请号 |
KR20060083271 |
申请日期 |
2006.08.31 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
RYU, SEONG WAN;CHOI, YANG KYU |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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