发明名称 NONVOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
摘要 <p>A non-volatile memory and a manufacturing method thereof are provided to ensure a wide memory margin and improve a characteristic of erasing operation and storage time. A non-volatile memory includes a substrate(100) and a gate structure. The gate structure has a tunneling dielectric layer(201) formed on the substrate, a first floating gate(202) formed on the tunneling dielectric layer, an interfacial dielectric layer(203) formed on the first floating gate, a second floating gate(204) formed on the facial dielectric layer and having a work function higher than the first floating gate, a control dielectric layer(205) formed on the second floating gate and a gate electrode(206) formed on the control dielectric layer.</p>
申请公布号 KR100806087(B1) 申请公布日期 2008.02.21
申请号 KR20060083271 申请日期 2006.08.31
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 RYU, SEONG WAN;CHOI, YANG KYU
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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