| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a system and a corresponding method for plotting an image on a thin material having variations in thickness. <P>SOLUTION: The system 40 includes a plotter unit 46 for plotting the image on a surface 48 of a thin material 42; a control unit 50 for controlling the plotter unit 46 for plotting; and a thickness measuring device 52 for measuring thickness 44 of the thin material 42. The control unit 50 receives measured thickness values from the thickness measuring device 52 and uses the measured thickness values for adjusting plotting of the image via the plotter unit 46 to compensate for variations in thickness 44 of the thin material 42. <P>COPYRIGHT: (C)2008,JPO&INPIT |
