发明名称 SILICON ANISOTROPIC ETCHING DEVICE AND SILICON ANISOTROPIC ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To conduct a stable silicon anisotroic etching, while preventing increase in the cost and decrese in the througput. SOLUTION: An Si wafer 2 and a chemical tank 4 for charging a chemical solution 1 for conducting an anisotropic etching of the Si wafer 2 are arranged in the inside of an etching draft 7 with a pipe 6 for emission connected. A heater 5 for heating the chemical solution 1 is provided at the bottom of the chemical tank 4. A hydrogen concentration meter 8 is provided in the etching draft 7 or in the pipe 6 for emission. The Si wafer 2 is etched with the hydrogen concentration value that is measured by the hydrogen concentration meter 8 monitored. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008041939(A) 申请公布日期 2008.02.21
申请号 JP20060214478 申请日期 2006.08.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MIYOSHI YUICHI
分类号 H01L21/306 主分类号 H01L21/306
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