发明名称 |
POLISHING PAD AND APPARATUS FOR CHEMICAL MECHANICAL POLISHING SEMICONDUCTOR SUBSTRATE HAVING THE SAME |
摘要 |
A polishing pad is provided to uniformly polish a wafer by forming a groove and plural patterns composed of channels on a surface of the polishing pad. A polishing pad includes a groove(211) for flow of slurry and plural patterns composed of trenches having a specific size. The patterns are formed by two trenches which are formed at two desired positions and extend in a direction in which an interval of the channels is gradually decreased. The patterns have a first V-shaped or U-shaped pattern and a second pattern which corresponds to the inversed first pattern. The first pattern and the second pattern intersect with each other in a radial direction of the polishing pad.
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申请公布号 |
KR20080015964(A) |
申请公布日期 |
2008.02.21 |
申请号 |
KR20060077396 |
申请日期 |
2006.08.17 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
CHOI, JAE YOUNG |
分类号 |
B24D99/00;H01L21/304;B24B37/26 |
主分类号 |
B24D99/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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