发明名称 POLISHING PAD AND APPARATUS FOR CHEMICAL MECHANICAL POLISHING SEMICONDUCTOR SUBSTRATE HAVING THE SAME
摘要 A polishing pad is provided to uniformly polish a wafer by forming a groove and plural patterns composed of channels on a surface of the polishing pad. A polishing pad includes a groove(211) for flow of slurry and plural patterns composed of trenches having a specific size. The patterns are formed by two trenches which are formed at two desired positions and extend in a direction in which an interval of the channels is gradually decreased. The patterns have a first V-shaped or U-shaped pattern and a second pattern which corresponds to the inversed first pattern. The first pattern and the second pattern intersect with each other in a radial direction of the polishing pad.
申请公布号 KR20080015964(A) 申请公布日期 2008.02.21
申请号 KR20060077396 申请日期 2006.08.17
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 CHOI, JAE YOUNG
分类号 B24D99/00;H01L21/304;B24B37/26 主分类号 B24D99/00
代理机构 代理人
主权项
地址