发明名称 DEVICE AND METHOD FOR PLANENESS TESTING
摘要 A device for testing planeness of an electrically conductive workpiece includes a platform for supporting the workpiece, a testing box movably fixed above the platform, an indicator, and a power supply. The testing box has a contact pin fixed on a bottom surface of the testing box. The contact pin is electrically wired in series with one electrode of the power supply. The platform is electrically wired in series with the other electrode of the power supply. The indicator is electrically wired in series with a testing circuit, which is made up of the power supply, the platform, and the contact pin. The contact pin is capable of movement above the platform at a distance which is equal to the sum of a thickness of the workpiece and a desired tolerance of the planeness, wherein if the planeness of the workpiece between the contact pin and the platform is out of tolerance, the testing circuit is closed, conducting power to the indicator, which will then indicate that the workpiece is ineligible.
申请公布号 US2008041142(A1) 申请公布日期 2008.02.21
申请号 US20070733210 申请日期 2007.04.10
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 ZHANG BING-JUN;GONG LIAN-ZHONG
分类号 G01B7/34 主分类号 G01B7/34
代理机构 代理人
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