发明名称 |
THIN FILM TRANSISTOT AND FABRICATION METHOD OF THE SAME |
摘要 |
<p>A thin film transistor and a manufacturing method of the same are provided to improve reliability and a yield by preventing the contamination of a semiconductor layer due to diffusion of impurities of a metal substrate in a thermal process. A buffer layer(110) is positioned on a metal substrate(100). A source electrode(120a) and a drain electrode(120b) are positioned on the buffer layer. A semiconductor layer(130) is positioned on the metal substrate including the source electrode and the drain electrode and includes a constant region corresponding to the source electrode and the drain electrode. A gate insulating layer(140) is positioned on the metal substrate including the semiconductor layer having the oxide. A gate electrode(150) is positioned on the gate insulating layer and corresponds to a constant region of the semiconductor layer.</p> |
申请公布号 |
KR20080016234(A) |
申请公布日期 |
2008.02.21 |
申请号 |
KR20060078053 |
申请日期 |
2006.08.18 |
申请人 |
LG.PHILIPS LCD CO., LTD. |
发明人 |
LEE, HO NYUN;KYUNG, JAE WOO;KIM, HONG GYU |
分类号 |
H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|