发明名称 METHOD AND APPARATUS FOR INSPECTING OPTICAL AMPLIFIER
摘要 <P>PROBLEM TO BE SOLVED: To provide an optical amplifier inspection method and optical amplifier inspecting apparatus, capable of realizing accurate inspection of the FWM cross stroke value inside an optical amplifier, while suppressing increase in the inspection cost. <P>SOLUTION: Light waves that oscillate from a plurality of signal light sources 1-1 to 40 that oscillate in a vertical single mode are multiplexed by a light multiplexer 4, and are inputted into an amplifier 20 for amplifying light under inspection. The light intensities of the light waves, outputted from the amplifier 20 for amplifying light under inspection, are measured for each signal wavelength by an optical spectrum analyzer 6, and FWM cross stroke value XT<SB>40</SB>(&lambda;) is obtained. The measured XT<SB>40</SB>(&lambda;) is corrected by the ratio of N<SB>80</SB>(&lambda;) to N<SB>40</SB>(&lambda;) that has been previously obtained. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008041928(A) 申请公布日期 2008.02.21
申请号 JP20060214175 申请日期 2006.08.07
申请人 NIPPON TELEGR & TELEPH CORP <NTT>;NTT ELECTORNICS CORP 发明人 ONO HIROTAKA;YAMADA MAKOTO;SAKAMOTO TADASHI;AOZASA SHINICHI;MORI ATSUSHI;SHIMIZU MAKOTO
分类号 H01S3/10;H01S3/06 主分类号 H01S3/10
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