发明名称 ANALYZING METHOD OF ELEMENT IN SAMPLE SUBJECTED TO MELTING TREATMENT IN INERT GAS ATMOSPHERE AND ANALYZER OF ELEMENT IN SAMPLE
摘要 PROBLEM TO BE SOLVED: To provide a method for analyzing an element in a sample with high measuring precision without using a high-pressure hydrogen gas as a calibration gas while ensuring reliability with respect to a measuring value, and an element analyzer. SOLUTION: In the element analyzer for measuring hydrogen or a plurality of elements containing hydrogen in the sample S subjected to melting treatment in an inert gas atmosphere, a hydrogen treatment part 5 having a hydrogen occluding alloy therein and capable of being heated and cooled is arranged to the sensitivity calibrating gas flow channel of a gas analyzer 2 for measuring hydrogen in a sample gas obtained by the melting treatment and hydrogen in the sample gas or the calibration gas is occluded as it keeps cooled. At the time of calibration of the gas analyzer 2, a specific carrier gas Ar is allowed to flow through the hydrogen treatment part 5 turned heated to calibrate the sensitivity of the gas analyzer 2. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008039643(A) 申请公布日期 2008.02.21
申请号 JP20060215952 申请日期 2006.08.08
申请人 HORIBA LTD 发明人 UCHIHARA HIROSHI;SAKAKURA SEIJI
分类号 G01N1/00;G01N1/22;G01N21/27;G01N21/61 主分类号 G01N1/00
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