发明名称 |
IMAGE SENSOR HAVING PHOTO DIODE WITH N-WELL AND METHOD OF FABRICATING THE SAME |
摘要 |
An image sensor having a photodiode with an n-well and a manufacturing method thereof are provided to increase a junction depth of the photodiode by forming the n-well before a depth n-type impurity region is formed. An active region defined by an isolation layer is disposed in a semiconductor substrate(1) having a p-well(PW). A transmission gate electrode(TG) is disposed to cross the active region on the semiconductor substrate. A shallow p-type impurity region(PPD) is disposed in the active region at one side of the transmission gate electrode. A deep n-type impurity region(NPD) is disposed under the shallow p-type impurity region. An n-well(NW) is diposed under the n-type impurity region to have a region shallower than the n-type impurity region.
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申请公布号 |
KR20080016067(A) |
申请公布日期 |
2008.02.21 |
申请号 |
KR20060077666 |
申请日期 |
2006.08.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, DOO CHEOL;MOON, CHANG ROK |
分类号 |
H01L27/14 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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