发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device with small noise sensitivity capable of suppressing a sampling dependent period of a sampling/hold error to a small value and realizing a highly accurate and stable sampling/hold. SOLUTION: At a sample/hold circuit 9, resistors 10 and 11 are connected to both assistant joints of a transistor 12, respectively, and a capacitor 13 is connected between a joint of another side of the resistor 11 and standard potential VSS. Since the resistors 10 and 11 are connected to both joints of the transistor 12 respectively as described, both of an input signal Vin side and a capacitor 13 side have a time constant of (Cg(: back gate capacity of the transistor 12)/2×R) during extraction and insertion of electron charge when the transistor 12 is turned on, and a hold offset voltageΔVhoff is set to qg/2Csh. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008042372(A) 申请公布日期 2008.02.21
申请号 JP20060211846 申请日期 2006.08.03
申请人 RENESAS TECHNOLOGY CORP 发明人 FUNAKI HIROSHI;FUJITA SATOSHI;SAWADAISHI TOMOYUKI
分类号 H03K17/00;G11B7/005;G11B7/09;G11B20/10;H03M1/12 主分类号 H03K17/00
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