发明名称 DRY ETCHING METHOD OR THE LIKE
摘要 PROBLEM TO BE SOLVED: To provide a dry etching device or the like capable of easily forming a taper to the side face of a trench formed to a work. SOLUTION: In a dry etching method, an etching gas and a deposition gas are introduced alternately into a reaction chamber 2, a plasma is generated, and the trench section 25 is formed to the work 4 fitted to the reaction chamber by the plasma. In the dry etching method, the other gas is added to one gas when the etching gas or the deposition gas is introduced into the reaction chamber 2, and both gases are introduced into the reaction chamber 2. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008041744(A) 申请公布日期 2008.02.21
申请号 JP20060210834 申请日期 2006.08.02
申请人 DAINIPPON PRINTING CO LTD 发明人 HIRABAYASHI MASASHI;OZAWA YUTAKA
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项
地址