发明名称 ILLUMINATION SYSTEM FOR PROJECTION EXPOSURE APPARATUS WITH WAVELENGTHS OF LESS THAN OR EQUAL TO 193 NM
摘要 <P>PROBLEM TO BE SOLVED: To provide an illumination system which utilizes available illumination light with high light yield and is characterized by low uniformity, ellipticity, and telecentricity errors. <P>SOLUTION: The disadvantage is overcome by an illumination system having a light source which emits radiation with wavelengths of less than or equal to 193 nm. The illumination system includes an optical component having a first facet with a field raster element in a plane provided with a first illumination, and provides a controlling equipment for illumination of an incompletely-illuminated region raster element which has at least a portion thereof unilluminated. The equipment can control uniformity of a second illumination in a region on an object plane. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008042203(A) 申请公布日期 2008.02.21
申请号 JP20070201745 申请日期 2007.08.02
申请人 CARK ZEISS SMT AG 发明人 ENDRES MARTIN;OSSMANN JENS
分类号 H01L21/027 主分类号 H01L21/027
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