ELECTROMIGRATION VERIFICATION DEVICE, ELECTROMIGRATION VERIFICATION METHOD, AND DATA STRUCTURE AND NETLIST USED THEREFOR

摘要

PROBLEM TO BE SOLVED: To achieve both of reduction of area and improvement of wiring reliability of an LSI by accurately deciding the necessity of layout modification for wiring having a plurality of current paths such as power source wiring. SOLUTION: This electromigration verification method includes an electromigration verification processing step comprising: a data input processing step; a netlist update processing step (first processing) for updating a netlist configured of wiring parasitic elements and device elements based on a current density restriction database and a characteristic fluctuation database and wiring current information; a current density calculation processing step (second processing) for calculating the current density of the wiring parasitic element from device currents and the updated netlist; a wiring current information update processing step (third processing) for updating the wiring current information based on the current density; a current density restriction value comparison decision processing step (fourth processing) for deciding whether or not the current density is within the limit from the updated wiring current information and a current density restriction database; a step decision processing process (fifth processing) for deciding the repeated processing from step information; and a result output processing process. COPYRIGHT: (C)2008,JPO&INPIT