发明名称 METHOD OF DETECTING DEFECT PIXEL AND APPARATUS USED IN THE SAME
摘要 A method and an apparatus for detecting a defective pixel are provided to extract a position of the defective pixel easily and correct pixel data of the defective pixel even though the defective pixel is variably positioned. A bayer pattern is filtered to prepare a filtered bayer pattern(S10). Coordinate data of a defective pixel are extracted by comparing the bayer pattern with the filtered bayer pattern(S50). In the filtered bayer pattern, a variation of pixel value of the defective pixel is reduced by influence of pixel values of peripheral pixels. The bayer pattern is filtered through blurring filtering. The bayer pattern is filtered by using a 5x5 window.
申请公布号 KR20080015545(A) 申请公布日期 2008.02.20
申请号 KR20060076988 申请日期 2006.08.16
申请人 MTEK VISION CO., LTD. 发明人 YANG, SEUNG IL
分类号 H04N5/367 主分类号 H04N5/367
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