发明名称 TRENCH-GATE FIELD EFFECT TRANSISTORS AND METHODS OF FORMING THE SAME
摘要 <p>A field effect transistor includes a body region of a first conductivity type over a semiconductor region of a second conductivity type. A gate trench extends through the body region and terminates within the semiconductor region. At least one conductive shield electrode is disposed in the gate trench. A gate electrode is disposed in the gate trench over but insulated from the at least one conductive shield electrode. A shield dielectric layer insulates the at lease one conductive shield electrode from the semiconductor region. A gate dielectric layer insulates the gate electrode from the body region. The shield dielectric layer is formed such that it flares out and extends directly under the body region.</p>
申请公布号 KR20080015863(A) 申请公布日期 2008.02.20
申请号 KR20077029511 申请日期 2006.05.24
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 YILMAZ HAMZA;CALAFUT DANIEL;KOCON CHRISTOPHER BOGUSLAW;SAPP STEVEN P.;PROBST DEAN E.;KRAFT NATHAN L.;GREBS THOMAS E.;RIDLEY RODNEY S.;DOLNY GARY M.;MARCHANT BRUCE D.;YEDINAK JOSEPH A.
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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