| 摘要 |
A semiconductor memory device and a method of testing the same are provided to reduce test time and test cost, by discriminating a read control circuit and a read sense amplifier circuit during a BIST(Built-In Self-Test). A semiconductor memory device comprises a semiconductor memory(11), an automatic operation control circuit(12) outputting a clock signal, a synchronous read control circuit(13), a read control circuit(14), a sense amplifier circuit(15) for read and a judgement circuit(16). The synchronous read control circuit outputs a synchronous read address by being synchronized with the clock signal. A read control circuit selects a read address of the semiconductor memory, according to an address of the synchronous read address. The sense amplifier circuit for read outputs a data read signal, as sensing data read out according to the read address. The judgment circuit compares the data read signal with an expected value.
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