发明名称 |
Apparatus for temporary thermal coupling of an electronic device to a heat sink during test |
摘要 |
A method, system and apparatus for testing an integrated circuit chip. The system including: means for forming a liquid polyalphaolefine layer on a bottom surface of the integrated circuit chip, a top surface of the integrated circuit chip having and a bottom surface not having signal and power pads; means for placing a surface of a heat sink into physical contact with the bottom surface of the polyalphaolefine layer; means for electrically coupling the integrated circuit chip to a tester; means for electrically testing the integrated circuit chip; means for electrically de-coupling the integrated circuit chip from the tester; means for removing the heat sink from contact with the polyalphaolefine layer, all or a portion of the polyalphaolefine layer remaining on the bottom surface of the integrated circuit chip; and means for removing the polyalphaolefine layer from the bottom surface of the integrated circuit chip.
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申请公布号 |
US7332927(B2) |
申请公布日期 |
2008.02.19 |
申请号 |
US20070743899 |
申请日期 |
2007.05.03 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
AUBE PAUL J.;COTE NORMAND;GAMACHE, JR. ROGER G.;GARDELL DAVID L.;GASCHKE PAUL M.;KNOX MARC D.;TURCOTTE DENIS D. |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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