| 发明名称 |
Method for determining a qualitative characteristic of an interferometric component |
| 摘要 |
The present invention relates to a method for determining a qualitative characteristic of an interferometric component (eg a planar waveguide structure) or a process for determining a qualitative characteristic of a stimulus of interest to which the interferometric component (eg the planar waveguide structure) has been exposed by measuring a non-positional characteristic of the interference fringes.
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| 申请公布号 |
US7333211(B2) |
申请公布日期 |
2008.02.19 |
| 申请号 |
US20040505917 |
申请日期 |
2004.08.27 |
| 申请人 |
FARFIELD SENSORS LIMITED |
发明人 |
FREEMAN NEVILLE JOHN;CROSS GRAHAM;RONAN GERARD ANTHONY |
| 分类号 |
G01B9/02;G01N21/64;B32B5/02;B32B27/04;B32B27/12;G01M11/00;G01N5/02;G01N21/00;G01N21/27;G01N21/45;G01N21/78;G01N33/543;G02B6/00 |
主分类号 |
G01B9/02 |
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