发明名称 High-density single transistor vertical memory gain cell
摘要 A memory cell which is formed on a substrate of a first conductivity type. A pillar of the first conductivity type extends vertically upward from the substrate. A source region of a second conductivity type is formed in the substrate extending adjacent to and away from a base of the pillar. A drain region of the second conductivity type is formed in an upper region of the pillar. A gate dielectric and conductor are arranged along a first side of the pillar. A capacitor dielectric and body capacitor plate are arranged along an opposite, second side of the pillar. A depletion region around the source region defines a floating body region within the pillar which forms both a body of an access transistor structure and a plate of a capacitor structure. The cell also provides gain with respect to charge stored within the floating body.
申请公布号 US7332418(B1) 申请公布日期 2008.02.19
申请号 US20060557229 申请日期 2006.11.07
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD
分类号 H01L21/44 主分类号 H01L21/44
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