| 发明名称 |
Apparatus for temperature and current leakage measurement in chip, has linear outlet, which varies with temperature, where apparatus has current inverter and electronic module that digitizes current inverter |
| 摘要 |
<p>The apparatus has a linear outlet, which varies with temperature. The apparatus has a current inverter and an electronic module that digitizes the current inverter.</p> |
| 申请公布号 |
ES2291143(A1) |
申请公布日期 |
2008.02.16 |
| 申请号 |
ES20070002109 |
申请日期 |
2007.07.27 |
| 申请人 |
UNIVERSIDAD POLITECNICA DE MADRID |
发明人 |
ITUERO HERRERO PABLO;AYALA RODRIGO JOSE LUIS;LOPEZ VALLEJO MARISA |
| 分类号 |
G01R31/30 |
主分类号 |
G01R31/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
