HALBLEITERBAUELEMENT, KARTE, VERFAHREN ZUR INITIALISIERUNG UND ZUR PRÜFUNG IHRER AUTHENTIZITÄT UND IHRER IDENTITÄT

摘要

The semiconductor device ( 11 ) of the invention comprises a circuit that is covered by a passivation structure. It is provided with a first security element ( 12 ) that comprises a local area of the passivation structure and which has a first impedance. Preferably, a plurality of security elements ( 12 ) is present, whose the impedances differ. The semiconductor device ( 11 ) further comprises measuring means ( 4 ) for measuring an actual value of the first impedance, and a memory (7) comprising a first memory element ( 7 A) for storing the actual value as a first reference value in the first memory element ( 7 A). The semiconductor device ( 11 ) of the invention can be initialized by a method wherein the actual value is stored as the first reference value. Its authenticity can be checked by comparison of the actual value again measured and the first reference value.