发明名称 |
SEMICONDUCTOR DEVICE, AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which solves cross talk problems and to provide its manufacturing method, in relation to a passive matrix element constituted of a memory element and a thin film transistor. SOLUTION: The memory element is equipped with a memory structure having: a pair of electrodes 110 and 113; a layer including an organic compound 112 between the pair of electrodes 110 and 113; and a first layer including a first metal oxide layer 111 and a second layer including a second metal oxide layer 114 between the pair of electrodes 110 and 113. The first metal oxide layer 111 serves as a p-type semiconductor layer and the second metal oxide layer 114 serves as a n-type semiconductor layer. The first layer including the first metal oxide layer 111 and the second layer including the second metal oxide layer 114 form a p-n junction, thereby the memory element is imparted with rectifying capability. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008034831(A) |
申请公布日期 |
2008.02.14 |
申请号 |
JP20070168627 |
申请日期 |
2007.06.27 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
NOMURA RYOJI;TOKUNAGA HAJIME;KATO KIYOSHI |
分类号 |
H01L27/28;H01L27/10;H01L45/00;H01L49/00;H01L51/05 |
主分类号 |
H01L27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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