发明名称 NITRIDE SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor element, where the costs are low and a breakdown voltage in a vertical direction is high. SOLUTION: In the nitride semiconductor element 1, an SOI substrate 2 is provided as a support substrate; an AlN layer 3 is formed on the SOI substrate 2 as a buffer layer; a GaN layer 4 is formed on the AlN layer 3 as a channel layer; an AlGaN layer 5 is formed on the GaN layer 4 as a barrier layer; and a source electrode 6, a drain electrode 7, and a gate electrode 8 are provided on the AlGaN layer 5. The SOI substrate 2 comprises a conductive Si substrate 21, an SiO<SB>2</SB>layer 22, and an Si layer 23, and has insulation properties in its thickness direction. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008034411(A) 申请公布日期 2008.02.14
申请号 JP20060202782 申请日期 2006.07.26
申请人 TOSHIBA CORP 发明人 SAITO YASUNOBU;SAITO WATARU;NODA TAKAO;NITTA TOMOHIRO
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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