发明名称 Method for manufacturing semiconductor device utilizing recrystallized semiconductor film formed on an insulating film
摘要 A method for manufacturing a semiconductor device, the method comprising: forming a semiconductor device using a crystalline semiconductor film after the surface of the crystalline semiconductor film with two plane directions or more is treated by chemical mechanical polishing, wherein an alkali solution with a hydrogen ion concentration of PH 11.0 or less is used as a polishing liquid in the chemical mechanical polishing.
申请公布号 US2008038883(A1) 申请公布日期 2008.02.14
申请号 US20070905934 申请日期 2007.10.05
申请人 SEIKO EPSON CORPORATION 发明人 SHIMADA HIROYUKI
分类号 H01L21/31;H01L21/84 主分类号 H01L21/31
代理机构 代理人
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