发明名称 NONVOLATILE SEMICONDUCTOR MEMORY ELEMENT AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory element and its manufacturing method. SOLUTION: The nonvolatile semiconductor memory element comprises a tunnel insulating film formed on a semiconductor substrate, an electric charge trap layer which is formed on the tunnel insulating film and includes a dielectric film of which a transition metal is doped, a blocking insulating film formed on the electric charge trap layer, and a gate electrode formed on the blocking insulating film. The dielectric film is preferred to be a high dielectric film such as HfO<SB>2</SB>film. Since a deep trap is formed by doping with a transition metal in the high dielectric film, a retention characteristics of the nonvolatile semiconductor memory element is improved. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008034814(A) 申请公布日期 2008.02.14
申请号 JP20070156400 申请日期 2007.06.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SHIN SANG-MIN;SETSU KOSHU;JIN YOUNG-GU
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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