发明名称 Electron beam etching device and method
摘要 Methods and devices for selective etching in a semiconductor process are shown. Chemical species generated in a reaction chamber provide both a selective etching function and concurrently form a protective coating on other regions. An electron beam provides activation to selective chemical species. In one example, reactive species are generated from a halogen and carbon containing gas source. Addition of other gasses to the system can provide functions such as controlling a chemistry in a protective layer during a processing operation.
申请公布号 US2008038928(A1) 申请公布日期 2008.02.14
申请号 US20060503681 申请日期 2006.08.14
申请人 MICRON TECHNOLOGY, INC. 发明人 RUEGER NEAL R.;WILLIAMSON MARK J.;SANDHU GURTEJ S.
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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