发明名称 DATA COLLECTION METHOD, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM
摘要 When measurement data collected with a specific sampling cycle by MCs from measuring instrument units are stored into a data storage means, a sampling control means adjusts the sampling cycle to a longer setting if the apparatus state is other than a substrate processing execution state (e.g., an idling state) compared to the sampling cycle set in the substrate processing execution state, so as to minimize the volume of data stored into the data storage means.
申请公布号 US2008040061(A1) 申请公布日期 2008.02.14
申请号 US20070774777 申请日期 2007.07.09
申请人 TOKYO ELECTRON LIMITED 发明人 OSADA SHIN
分类号 G06F19/00;G01N1/00;G01N37/00 主分类号 G06F19/00
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