发明名称 Method Of Making Grating Structures Having High Aspect Ratio
摘要 A method for realizing a grating structure including the steps of providing a layered structure having a substrate, a grating layer, a first masking layer of polysilicon, a dielectric layer and a second masking layer. Additionally, a resist layer is deposited on the second masking layer; the resist layer is exposed according to a selected pattern to an electron beam; the resist layer is developed according to the pattern; the second masking layer is etched using the developed resist layer as a mask to form a patterned second masking layer; the dielectric layer is etched using the patterned second masking layer as a hard mask to form a patterned dielectric layer; the first masking layer is etched using the patterned dielectric layer as a hard mask to form a patterned first masking layer; and the grating layer is etched using the patterned first masking layer as a hard mask to form the grating structure.
申请公布号 US2008038660(A1) 申请公布日期 2008.02.14
申请号 US20040579167 申请日期 2004.05.21
申请人 DONEDA SERGIO;MORSON ROMANO;SARDO STEFANO 发明人 DONEDA SERGIO;MORSON ROMANO;SARDO STEFANO
分类号 G02B5/18;G02B6/12;G02B6/124;G02B6/34 主分类号 G02B5/18
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