发明名称 |
Method Of Making Grating Structures Having High Aspect Ratio |
摘要 |
A method for realizing a grating structure including the steps of providing a layered structure having a substrate, a grating layer, a first masking layer of polysilicon, a dielectric layer and a second masking layer. Additionally, a resist layer is deposited on the second masking layer; the resist layer is exposed according to a selected pattern to an electron beam; the resist layer is developed according to the pattern; the second masking layer is etched using the developed resist layer as a mask to form a patterned second masking layer; the dielectric layer is etched using the patterned second masking layer as a hard mask to form a patterned dielectric layer; the first masking layer is etched using the patterned dielectric layer as a hard mask to form a patterned first masking layer; and the grating layer is etched using the patterned first masking layer as a hard mask to form the grating structure.
|
申请公布号 |
US2008038660(A1) |
申请公布日期 |
2008.02.14 |
申请号 |
US20040579167 |
申请日期 |
2004.05.21 |
申请人 |
DONEDA SERGIO;MORSON ROMANO;SARDO STEFANO |
发明人 |
DONEDA SERGIO;MORSON ROMANO;SARDO STEFANO |
分类号 |
G02B5/18;G02B6/12;G02B6/124;G02B6/34 |
主分类号 |
G02B5/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|