发明名称 Three-dimensional and lengthwise-running testing contour e.g. recess, irregularity testing method, involves recording longitudinal positions of contour from different angles, where angles are observed in side view towards running direction
摘要 <p>The method involves moving a testing head (6) relative to a testing contour e.g. recess (2a) in a running direction. Longitudinal positions of the contour are recorded from different angles, where the angles are observed in a side view towards the running direction of the testing contour. The contour is covered in the process direction. Images of the contour are received from optical sensors (12, 12`). Check is made whether an image has a small irregularity, which is in the form of a hole. An independent claim is also included for a testing head comprising optical sensors.</p>
申请公布号 DE102006036586(A1) 申请公布日期 2008.02.14
申请号 DE20061036586 申请日期 2006.08.04
申请人 REITER, MATHIAS 发明人 REITER, MATHIAS
分类号 G01B11/25 主分类号 G01B11/25
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