发明名称 METHOD AND APPARATUS FOR VERIFYING LAYOUT
摘要 PROBLEM TO BE SOLVED: To solve the problem with the calculation of the source voltage fluctuation of a semiconductor memory whose capacity is increased wherein a very large amount of data is required, resulting in very large amounts of computer resources such as CPU time, memory capacity, disk capacity, etc. SOLUTION: This method for verifying layout uses a simple model consisting only of a row decoder and a column decoder for which a memory array has been selected, and a mat. A reduced netlist is created out of the simple model and a current waveform is calculated to simulate the source voltage fluctuation. By making the memory array into a simple model, computer resources such as CPU time, memory capacity, disk capacity, etc., can be greatly reduced. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008033404(A) 申请公布日期 2008.02.14
申请号 JP20060203052 申请日期 2006.07.26
申请人 ELPIDA MEMORY INC 发明人 NAKAO MASUMI
分类号 G06F17/50;H01L21/82 主分类号 G06F17/50
代理机构 代理人
主权项
地址